Engineering Circuit Analysis Volume 1: A Practical and Theoretical Approach to Circuit Engineering

To give students an understanding of the laws governing the quiescent, frequency domain and small-signal behaviour of electrical circuits, and the ability to apply this understanding to the analysis and design of circuit behaviour To give students an understanding of the analysis and design of common circuits such as those involving operational amplifiers.

By the end of the course, a student should understand, and be able to apply to both analysis and design: - the overall process of design, including modelling - component description (resistors and controlled sources) - Kirchoff's Laws - equivalence: Thevenin and Norton models - superposition - nodal analysis - the handling of controlled sources - component description - capacitors and inductors - significance of phase relationships - concept of complex voltages and currents - extension of Kirchoff's Laws to complex voltages and currents - the relevance of linear circuits theorems to frequency-domain behaviour - asymptotic behaviour The Operational Amplifier (opamp) - the characteristics of the opamp - the mathematical operations that can be achieved with opamps - feedback and stability; gain-bandwidth limitations. First-order transients: - passive CR and LR circuits - transients in active circuits. Transmission lines: - forward and backward waves, reflections, standing waves.

Engineering Circuit Analysis Volume 1

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Circuit variables; voltage, current, charge and power Circuit elements Kirchoff's current and voltage laws Nodal analysis for resistor circuits Transient analysis of 1st order RC and RL circuits Superposition Thevenin and Norton theorems Controlled sources Phasors and phasor analysis Transfer functions and Filters Operational amplifier circuits, systematic nodal analysis, Power in AC circuits, Transmission lines.

With each technology generation, the effects of on-chip variations are seen to more profoundly affect digital circuit behavior. These variations may arise from fluctuations attributed to the manufacturing process (e.g., drifts in channel length, oxide thickness, threshold voltage, or doping concentration), which affect the circuit yield, as well as variations in the environmental operating conditions (e.g., supply voltage or temperature) after the circuit is manufactured, which impact the performance of the design. These effects can cause unacceptable alterations in circuit performance parameters such as timing and power, and variation-tolerant design is imperative for next-generation designs. This paper overviews research in this area, describing methods for the analysis and optimization of statistical effects.

N2 - With each technology generation, the effects of on-chip variations are seen to more profoundly affect digital circuit behavior. These variations may arise from fluctuations attributed to the manufacturing process (e.g., drifts in channel length, oxide thickness, threshold voltage, or doping concentration), which affect the circuit yield, as well as variations in the environmental operating conditions (e.g., supply voltage or temperature) after the circuit is manufactured, which impact the performance of the design. These effects can cause unacceptable alterations in circuit performance parameters such as timing and power, and variation-tolerant design is imperative for next-generation designs. This paper overviews research in this area, describing methods for the analysis and optimization of statistical effects.

AB - With each technology generation, the effects of on-chip variations are seen to more profoundly affect digital circuit behavior. These variations may arise from fluctuations attributed to the manufacturing process (e.g., drifts in channel length, oxide thickness, threshold voltage, or doping concentration), which affect the circuit yield, as well as variations in the environmental operating conditions (e.g., supply voltage or temperature) after the circuit is manufactured, which impact the performance of the design. These effects can cause unacceptable alterations in circuit performance parameters such as timing and power, and variation-tolerant design is imperative for next-generation designs. This paper overviews research in this area, describing methods for the analysis and optimization of statistical effects.

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